MPG.eBooks - Search Results - Spectroscopy And Microscopy

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Secondary Ion Mass Spectrometry SIMS III : Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30–September 5, 1981

Published 1982

Springer Berlin Heidelberg

Table of Contents: “... Applications of Ionic Microscopy -- Secondary Ion Mass Spectrometry of Organic Compounds -- Index...”

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Defect Complexes in Semiconductor Structures : Proceedings of the International School Held in Mátrafüred, Hungary, September 13 – 17, 1982

Published 1983

Springer Berlin Heidelberg

Table of Contents: “... paramagnetic resonance and related techniques -- Review of the possibilities of electron microscopy...”