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Electromigration in thin films and electronic devices : materials and reliability
by
Kim, Choong-Un
Published 2011
Woodhead Pub.
“
...
Woodhead
Publishing
in
materials
...
”
Call Number:
TA418.9.T45
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Author: Kim, Choong-Un
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620 - Engineering & allied operations
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621 - Applied physics
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English
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O'Reilly
1
Author
Kim, Choong-Un
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