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author_facet:"Kasprzak, Lucian"
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Reliability and failure of electronic materials and devices
by
Ohring, Milton
Published 2014
Academic Press is an imprint of Elsevier
Table of Contents:
“
...9.2 the nature of
contacts
11.2 nondestructive examination and decapsulation; 12.2 integrated...
”
Call Number:
TK7870.23
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Author: Kasprzak, Lucian
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620 - Engineering & allied operations
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621 - Applied physics
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Kasprzak, Lucian
Ohring, Milton
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