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1
Scanning Electron Microscopy and X-Ray Microanalysis : Third Edition
by
Goldstein, Joseph
,
Newbury, Dale E.
,
Joy, David C.
,
Lyman, Charles E.
Published 2003
Springer US
Table of Contents:
“
...5.2. STEM-in-SEM: High Resolution for the Special Case of
Thin
Specimens -- 5.3.
Surface
Imaging...
”
Read Now
2
Scanning Electron Microscopy and X-Ray Microanalysis : A Text for Biologists, Materials Scientists, and Geologists
by
Goldstein, Joseph
,
Newbury, Dale E.
,
Echlin, Patrick
,
Joy, David C.
Published 1981
Springer US
Table of Contents:
“
... -- 7.6. Analysis of
Thin
Films
and Foils -- 7.7. Quantitative Analysis of Biological Material -- Appendix...
”
Read Now
3
Scanning Electron Microscopy and X-Ray Microanalysis : A Text for Biologists, Materials Scientists, and Geologists
by
Goldstein, Joseph
,
Newbury, Dale E.
,
Echlin, Patrick
,
Joy, David C.
Published 1992
Springer US
Table of Contents:
“
... Conductivity Staining Methods -- 13.5. Specimen Mounting Procedures -- 13.6.
Thin
-
Film
Methods -- 13.7. Thermal...
”
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Author: Joy, David C.
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550 - Earth sciences
2
620 - Engineering & allied operations
1
Language
English
3
Collection
Springer Book Archives -2004
3
Author
Goldstein, Joseph
3
Joy, David C.
Newbury, Dale E.
3
Echlin, Patrick
2
Lyman, Charles E.
1
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