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author_facet:"Joy, David C."
language:"English"
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1
Scanning Electron Microscopy and X-Ray Microanalysis : Third Edition
by
Goldstein, Joseph
,
Newbury, Dale E.
,
Joy, David C.
,
Lyman, Charles E.
Published 2003
Springer US
Table of Contents:
“
.... Depth-of-Focus Mode -- 2.1.2.4. Low-Voltage Mode -- 2.1.3. Why Learn about Electron
Optics
? --
2.2
...
”
Read Now
2
Scanning Electron Microscopy and X-Ray Microanalysis : A Text for Biologists, Materials Scientists, and Geologists
by
Goldstein, Joseph
,
Newbury, Dale E.
,
Echlin, Patrick
,
Joy, David C.
Published 1992
Springer US
Table of Contents:
“
... Preparation for Inorganic
Materials
: Microstructural and Microchemical Analysis -- 11.1. Metals -- 11.2...
”
Read Now
3
Scanning Electron Microscopy and X-Ray Microanalysis : A Text for Biologists, Materials Scientists, and Geologists
by
Goldstein, Joseph
,
Newbury, Dale E.
,
Echlin, Patrick
,
Joy, David C.
Published 1981
Springer US
Table of Contents:
“
... of the Electron Probe Microanalyzer -- 1.3. Outline of This Book -- 2. Electron
Optics
-- 2.1. Electron Guns...
”
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550 - Earth sciences
2
620 - Engineering & allied operations
1
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Springer Book Archives -2004
3
Author
Goldstein, Joseph
3
Joy, David C.
Newbury, Dale E.
3
Echlin, Patrick
2
Lyman, Charles E.
1
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