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1
Published 2008
Springer Berlin Heidelberg
Table of Contents: “...X-Ray Diffraction Residual Stress Analysis: One of the Few Advanced Physical Measuring Techniques...”
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2
Published 2008
Springer Berlin Heidelberg
Subjects: “...Condensed Matter Physics...”
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3
Published 2009
Springer Berlin Heidelberg
Subjects: “...Condensed Matter Physics...”
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4
Published 2001
Springer Berlin Heidelberg
Subjects: “...Condensed matter...”