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1
Published 1975
Springer US
Table of Contents: “... Range and Spatial Distribution of the Primary Electron Beam -- III. Emitted Electrons—Backscattered...”
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2 “... the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron...”
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3
Published 1986
Springer US
“... in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image...”