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Kelvin Probe Force Microscopy : From Single Charge Detection to Device Characterization
Published 2018
Springer International Publishing
“
...Springer Series in
Surface
Sciences
...
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Kelvin Probe Force Microscopy : Measuring and Compensating Electrostatic Forces
Published 2012
Springer Berlin Heidelberg
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...Springer Series in
Surface
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Author: Glatzel, Thilo
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543 - Analytical chemistry
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620 - Engineering & allied operations
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English
2
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Springer eBooks 2005-
2
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Glatzel, Thilo
Sadewasser, Sascha
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