MPG.eBooks - Search Results - "ironic"

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Secondary Ion Mass Spectrometry SIMS III : Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30–September 5, 1981

Published 1982

Springer Berlin Heidelberg

Table of Contents: “...IV. Quantification -- Quantification of SIMS -- Quantitative Chemical Analysis of Standard Iron...”

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Defect Complexes in Semiconductor Structures : Proceedings of the International School Held in Mátrafüred, Hungary, September 13 – 17, 1982

Published 1983

Springer Berlin Heidelberg

Table of Contents: “... with experimental results -- A new model for the Si-A center -- Defect complexing in iron-doped silicon...”