Toggle navigation
Campus Access
About MPG.eBooks
Skip to content
Search Tips
Home
>
Search: microscopes
Language
English
Deutsch
Español
Français
Italiano
日本語
Nederlands
Português
Português (Brasil)
中文(简体)
中文(繁體)
Türkçe
עברית
Gaeilge
Cymraeg
Ελληνικά
Català
Euskara
Русский
Čeština
Suomi
Svenska
polski
Dansk
slovenščina
اللغة العربية
বাংলা
Galego
Tiếng Việt
Hrvatski
हिंदी
All Fields
Title
Person
Topic
ISBN/ISSN
Year
Collection
Advanced
Retain my current filters
author_facet:"Fuchs, Harald"
Search alternatives
:
microscopes »
microscope
,
microscopy
,
microscopic
Showing
1
-
11
of
11
Search:
'microscopes'
,
query time: 0.02s
Book List
0
Sort:
Relevance
Year Descending
Year Ascending
Author
Title
Read Now
1
Applied Scanning Probe Methods III : Characterization
Published 2006
Springer Berlin Heidelberg
“
... atoms. At ?rst there were two – the Scanning Tunneling
Microscope
, or STM, and the Atomic Force Mic...
”
Read Now
2
Applied Scanning Probe Methods II : Scanning Probe Microscopy Techniques
Published 2006
Springer Berlin Heidelberg
“
.... At ?rst there were two – the Scanning Tunneling
Microscope
, or STM, and the Atomic Force Mic- scope...
”
Read Now
3
Applied Scanning Probe Methods VIII : Scanning Probe Microscopy Techniques
Published 2008
Springer Berlin Heidelberg
Table of Contents:
“
... in Scanning Electron and Ion
Microscopes
: Tools for Nanomechanics, Nanoanalytics, and Nanofabrication...
”
Read Now
4
Applied Scanning Probe Methods X : Biomimetics and Industrial Applications
Published 2008
Springer Berlin Heidelberg
Table of Contents:
“
... of Scanning Probe Methods in Chemical Mechanical Planarization -- Scanning Probe
Microscope
Application...
”
Read Now
5
Applied Scanning Probe Methods V : Scanning Probe Microscopy Techniques
Published 2007
Springer Berlin Heidelberg
Table of Contents:
“
...Integrated Cantilevers and Atomic Force
Microscopes
-- Electrostatic Microscanner -- Low-Noise...
”
Read Now
6
Applied Scanning Probe Methods XI : Scanning Probe Microscopy Techniques
Published 2009
Springer Berlin Heidelberg
Table of Contents:
“
...Oscillation Control in Dynamic SPM with Quartz Sensors -- Atomic Force
Microscope
Cantilevers Used...
”
Read Now
7
Applied Scanning Probe Methods IV : Industrial Applications
Published 2006
Springer Berlin Heidelberg
Table of Contents:
“
...
Microscope
Cantilevers...
”
Read Now
8
Applied Scanning Probe Methods XIII : Biomimetics and Industrial Applications
Published 2009
Springer Berlin Heidelberg
Table of Contents:
“
... -- Atomic Force
Microscopic
Study of Piezoelectric Polymers -- Quantitative Analysis of Surface Morphology...
”
Read Now
9
Applied Scanning Probe Methods IX : Characterization
Published 2008
Springer Berlin Heidelberg
Table of Contents:
“
... Nanoscale View of Microbial Surfaces Using the Atomic Force
Microscope
-- Cellular Physiology of Epithelium...
”
Read Now
10
Applied Scanning Probe Methods I
Published 2004
Springer Berlin Heidelberg
Table of Contents:
“
...: Capacitance Storage Using a Ferroelectric Medium and a Scanning Capacitance
Microscope
(SCM). K. Matsumoto...
”
Read Now
11
Applied Scanning Probe Methods XII : Characterization
Published 2009
Springer Berlin Heidelberg
“
.... Additi- ally they might be damaged by the electron beam of the
microscope
or the vacuum might cause...
”
Back
Narrow Search
Remove Filters
Clear Filter
Author: Fuchs, Harald
Year of Publication
From:
To:
Classification
621 - Applied physics
10
620 - Engineering & allied operations
1
Language
English
11
Collection
Springer eBooks 2005-
10
Springer Book Archives -2004
1
Author
Bhushan, Bharat
11
Fuchs, Harald
Tomitori, Masahiko
3
Hosaka, Sumio
1
Kawata, Satoshi
1
Search Tools
Get RSS Feed
Share Search
https://ebooks.mpdl.mpg.de/ebooks/Search/Results?filter%5B%5D=author_facet%3A%22Fuchs%2C+Harald%22&lookfor=microscopes&type=AllFields
Send by Email
×
Loading...