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author_facet:"Fuchs, Harald"
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1
Applied Scanning Probe Methods IX : Characterization
Published 2008
Springer Berlin Heidelberg
Table of Contents:
“
...Ultrathin
Fullerene
-Based Films via STM and STS -- Quantitative Measurement of Materials Properties...
”
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2
Applied Scanning Probe Methods III : Characterization
Published 2006
Springer Berlin Heidelberg
Table of Contents:
“
... for Contact and Wear Simulation -- AFM Applications for Analysis of
Fullerene
-Like Nanoparticles -- Scanning...
”
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3
Applied Scanning Probe Methods VIII : Scanning Probe Microscopy Techniques
Published 2008
Springer Berlin Heidelberg
“
.... The volume covers a broad spectrum of STM/AFM investigations including
fullerene
layers, force spectroscopy...
”
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4
Applied Scanning Probe Methods X : Biomimetics and Industrial Applications
Published 2008
Springer Berlin Heidelberg
“
.... The volume covers a broad spectrum of STM/AFM investigations including
fullerene
layers, force spectroscopy...
”
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621 - Applied physics
4
Language
English
4
Collection
Springer eBooks 2005-
4
Author
Bhushan, Bharat
4
Fuchs, Harald
Tomitori, Masahiko
3
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