1
Published 1998
Springer New York
Table of Contents: ... Developable surfaces -- 4.2 Properties of developable surfaces -- 4.3 Developable Bézier surfaces -- 4.4 Open...

2
by Friedman, Avner
Published 1995
Springer New York
Table of Contents: ... profiling by inverse device methods -- 13.1 Semiconductor devices -- 13.2 Measuring doping profile by direct...

3
by Friedman, Avner
Published 1992
Springer New York
Table of Contents: ... properties of composite materials -- 10.1 Elastic moduli of a composite -- 10.2 The Hashin—Strikman bounds...