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1
Ion Spectroscopies for Surface Analysis
Published 1991
Springer US
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Specimen Handling, Preparation, and Treatments in Surface Characterization
Published 1998
Springer US
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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis
Published 2002
Springer US
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Author: Czanderna, Alvin W.
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543 - Analytical chemistry
2
620 - Engineering & allied operations
1
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English
3
Collection
Springer Book Archives -2004
3
Author
Czanderna, Alvin W.
Madey, Theodore E.
2
Powell, Cedric J.
2
Hercules, David M.
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