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author_facet:"Cohen, Samuel H."
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1
Atomic Force Microscopy/Scanning Tunneling Microscopy 2
Published 1997
Springer US
Table of Contents:
“
... Force Microscopy Studies of Selected Videotapes --
Surface
Characteristics Evaluation of
Thin
Films
...
”
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2
Atomic Force Microscopy/Scanning Tunneling Microscopy
Published 1994
Springer US
Table of Contents:
“
... Nanoclusters on Mica -- Comparative Study of the
Surface
Roughness of Oxide
Thin
Films
-- Methodologies...
”
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3
Atomic Force Microscopy/Scanning Tunneling Microscopy 3
Published 2002
Springer US
Table of Contents:
“
...
Surface
Structure and Intercalative Polymerization Studies of Smectite Clay
Thin
Films
-- Atomic...
”
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Author: Cohen, Samuel H.
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620 - Engineering & allied operations
3
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English
3
Collection
Springer Book Archives -2004
3
Author
Cohen, Samuel H.
Lightbody, Marcia L.
3
Bray, M.T.
1
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