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1
by Wang, Laung-Terng
Published 2009
Morgan Kaufmann Publishers/Elsevier
Table of Contents: “...Ch. 14. Fault Simulation and Test Generation / James C.-M. Li and Michael S. Hsiao...”
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2
by Ho, Tsung-Yi, Chang, Yao-Wen, Chen, Sao-Jie
Published 2007
Springer Netherlands
“...As Moore's Law continues unencumbered into the nanometer era, chips are reaching 1000 M gates...”