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1
by Williams, David B., Carter, C. Barry
Published 2009
Springer US
Table of Contents: “... -- Imaging Strain Fields -- Weak-Beam Dark-Field Microscopy -- High-Resolution TEM -- Other Imaging...”
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2
Published 2016
Springer International Publishing
Table of Contents: “.... Energy-Filtered Transmission Electron Microscopy -- 14. Calculation of Electron Energy-Loss Spectra -- 15...”
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3
by Williams, David B., Carter, C. Barry
Published 1996
Springer US
Table of Contents: “... -- 26 Weak-Beam Dark-Field Microscopy -- 27 Phase-Contrast Images -- 28 High-Resolution TEM -- 29 Image...”
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4
Published 2021
Springer Nature Singapore
Table of Contents: “...Electron Microscopy: An important tool for preparation and characterization of asymmetric ceramic...”