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Field Emission Scanning
Electron
Microscopy
: New Perspectives for Materials Characterization
by
Brodusch, Nicolas
,
Demers, Hendrix
,
Gauvin, Raynald
Published 2018
Springer Nature Singapore
“
... generation of cold-field emission scanning
electron
microscopes
applied to real materials at high spatial...
”
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620 - Engineering & allied operations
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Springer eBooks 2005-
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Brodusch, Nicolas
Demers, Hendrix
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Gauvin, Raynald
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