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author_facet:"Bardell, Paul H."
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Built-in test for VLSI : pseudorandom techniques
by
Bardell, Paul H.
Published 1987
Wiley
Subjects:
“
...
Electrical
Engineering
/ hilcc...
”
Call Number:
TK7874
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620 - Engineering & allied operations
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Bardell, Paul H.
McAnney, William H.
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Savir, Jacob
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