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1
Published 2007
Springer New York
“... with the technique used (e.g. Electron Impact (E.I.), Fast Atom Bombardment (FAB), positive ion or negative ion mode...”
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2
Published 2006
Springer US
“... with the technique used (e.g. Electron Impact (E.I.), Fast Atom Bombardment (FAB), positive ion or negative ion mode...”
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3
Published 2007
Springer US
“... with the technique used (e.g. Electron Impact (E.I.), Fast Atom Bombardment (FAB), positive ion or negative ion mode...”
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4
Published 2006
Springer US
“... with the technique used (e.g. Electron Impact (E.I.), Fast Atom Bombardment (FAB), positive ion or negative ion mode...”
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5
Published 2006
Springer New York
“... with the technique used (e.g. Electron Impact (E.I.), Fast Atom Bombardment (FAB), positive ion or negative ion mode...”
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6
Published 2006
Springer New York
“... with the technique used (e.g. Electron Impact (E.I.), Fast Atom Bombardment (FAB), positive ion or negative ion mode...”