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author_facet:"Agarwal, Ritu"
dewey-ones:"670 - Manufacturing"
language:"English"
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The Benefits of Combining Data With Empathy
by
Weill, Peter
,
Agarwal, Ritu
Published 2012
MIT Sloan Management Review
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Author: Agarwal, Ritu
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Classification: 670 - Manufacturing
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000 - Computer science, information & general works
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658 - General management
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670 - Manufacturing
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O'Reilly
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Author
Agarwal, Ritu
Weill, Peter
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