Borja, J. P., Lu, T., & Plawsky, J. (2016). Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms (1st ed. 2016.). Cham: Springer International Publishing.
Chicago Style CitationBorja, Juan Pablo, Toh-Ming Lu, and Joel Plawsky. Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms. 1st ed. 2016. Cham: Springer International Publishing, 2016.
MLA CitationBorja, Juan Pablo, Toh-Ming Lu, and Joel Plawsky. Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms. 1st ed. 2016. Cham: Springer International Publishing, 2016.
Warning: These citations may not always be 100% accurate.