Accelerating Test, Validation and Debug of High Speed Serial Interfaces

High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive in...

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Bibliographic Details
Main Authors: Fan, Yongquan, Zilic, Zeljko (Author)
Format: eBook
Language:English
Published: Dordrecht Springer Netherlands 2011, 2011
Edition:1st ed. 2011
Subjects:
Online Access:
Collection: Springer eBooks 2005- - Collection details see MPG.ReNa