Rein, S. (2005). Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications (1st ed. 2005.). Berlin, Heidelberg: Springer Berlin Heidelberg.
Chicago Style CitationRein, Stefan. Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications. 1st ed. 2005. Berlin, Heidelberg: Springer Berlin Heidelberg, 2005.
MLA CitationRein, Stefan. Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications. 1st ed. 2005. Berlin, Heidelberg: Springer Berlin Heidelberg, 2005.
Warning: These citations may not always be 100% accurate.