APA Citation

(2000). Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159). New York: The Institute of Electrical and Electronics Engineers, Inc.

Chicago Style Citation

Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159). New York: The Institute of Electrical and Electronics Engineers, Inc, 2000.

MLA Citation

Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159). New York: The Institute of Electrical and Electronics Engineers, Inc, 2000.

Warning: These citations may not always be 100% accurate.