(2000). Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159). New York: The Institute of Electrical and Electronics Engineers, Inc.
Chicago Style CitationProceedings International Test Conference 2000 (IEEE Cat. No.00CH37159). New York: The Institute of Electrical and Electronics Engineers, Inc, 2000.
MLA CitationProceedings International Test Conference 2000 (IEEE Cat. No.00CH37159). New York: The Institute of Electrical and Electronics Engineers, Inc, 2000.
Warning: These citations may not always be 100% accurate.