(2010). 2010 Third International Conference on Dependability. New York: The Institute of Electrical and Electronics Engineers, Inc.
Chicago Style Citation2010 Third International Conference On Dependability. New York: The Institute of Electrical and Electronics Engineers, Inc, 2010.
MLA Citation2010 Third International Conference On Dependability. New York: The Institute of Electrical and Electronics Engineers, Inc, 2010.
Warning: These citations may not always be 100% accurate.