(2006). Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V. Bellingham, Wash: SPIE.
Chicago Style CitationReliability, Packaging, Testing, and Characterization of MEMS/MOEMS V. Bellingham, Wash: SPIE, 2006.
MLA CitationReliability, Packaging, Testing, and Characterization of MEMS/MOEMS V. Bellingham, Wash: SPIE, 2006.
Warning: These citations may not always be 100% accurate.