Table of Contents:
  • Contents: Particle characterization
  • Types of particles
  • Nanotechnology
  • Colloids
  • Particle size distribution statistics
  • Particle characterization techniques
  • Light microscopy
  • Optical microscopy
  • Light obscuration
  • Static Light Scattering (SLS) and Dynamic Light Scattering (DLS)
  • Zeta potential
  • Coulter counting
  • Atomic Force Microscopy (AFM)
  • Advanced microscopy techniques