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author_facet:"Fuchs, Harald"
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1
Applied Scanning Probe Methods III : Characterization
Published 2006
Springer Berlin Heidelberg
“
...
Electron
Microscope
or SEM. The probe microscopes do not require preparation of the sample and they operate...
”
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2
Applied Scanning Probe Methods II : Scanning Probe Microscopy Techniques
Published 2006
Springer Berlin Heidelberg
“
...
Electron
Microscope
or SEM. The probe microscopes do not require preparation of the sample and they operate...
”
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Author: Fuchs, Harald
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621 - Applied physics
2
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English
2
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Springer eBooks 2005-
2
Author
Bhushan, Bharat
2
Fuchs, Harald
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