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1
by Director, Stephen W., Maly, Wojciech, Strojwas, Andrzej J.
Published 1990
Springer US
Table of Contents: “...1. Yield Estimation and Prediction -- 1.1. Introduction -- 1.2. The VLSI Fabrication Process -- 1.3...”
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2
by Khare, Jitendra B., Maly, Wojciech
Published 1996
Springer US
“... is to improve manufacturing yield. Modern VLSI research and engineering (which includes design manufacturing...”