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author_facet:"Lu, Toh-Ming"
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Dielectric Breakdown in Gigascale Electronics : Time Dependent Failure Mechanisms
by
Borja, Juan Pablo
,
Lu, Toh-Ming
,
Plawsky, Joel
Published 2016
Springer International Publishing
Subjects:
“
...
Nanotechnology
and Microengineering...
”
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2
RHEED Transmission Mode and Pole Figures : Thin Film and Nanostructure Texture Analysis
by
Wang, Gwo-Ching
,
Lu, Toh-Ming
Published 2014
Springer New York
Subjects:
“
...
Nanotechnology
and Microengineering...
”
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620 - Engineering & allied operations
2
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Springer eBooks 2005-
2
Author
Lu, Toh-Ming
Borja, Juan Pablo
1
Plawsky, Joel
1
Wang, Gwo-Ching
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