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author_facet:"Egerton, R.F."
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Physical Principles of Electron Microscopy : An Introduction to TEM, SEM, and AEM
by
Egerton, R.F.
Published 2005
Springer US
Subjects:
“
...
Characterization
and
Evaluation
of
Materials
...
”
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2
Electron Energy-Loss Spectroscopy in the Electron Microscope
by
Egerton, R.F.
Published 1996
Springer US
Subjects:
“
...
Characterization
and
Evaluation
of
Materials
...
”
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Author: Egerton, R.F.
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570 - Life sciences; biology
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620 - Engineering & allied operations
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English
2
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Springer Book Archives -2004
1
Springer eBooks 2005-
1
Author
Egerton, R.F.
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