MPG.eBooks - Search Results - (aloe OR alle)

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1

716-1995 - IEEE Standard Test Language for All Systems - Common/Abbreviated Test Language for All Systems (C/ATLAS)

Published 1995

The Institute of Electrical and Electronics Engineers, Inc.

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2

1222-2003 - IEEE Standard for All-Dielectric Self-Supporting Fiber Optic Cable

Published 2004

The Institute of Electrical and Electronics Engineers, Inc.

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3

1232-2010 - IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)

Published 2011

The Institute of Electrical and Electronics Engineers, Inc.

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4

1232-2002 - (Replaced) IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI- ESTATE)

Published 2002

The Institute of Electrical and Electronics Engineers, Inc.

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5

1591.2-2017 - IEEE Standard for Testing and Performance of Hardware for All-Dielectric Self-Supporting (ADSS) Fiber Optic Cable

Published 2018

The Institute of Electrical and Electronics Engineers, Inc.

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6

1232.3-2014 - IEEE Guide for the Use of Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)

Published 2014

The Institute of Electrical and Electronics Engineers, Inc.

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7

1232.2-1998 - IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE): Service Specification

Published 1999

The Institute of Electrical and Electronics Engineers, Inc.

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8

C37.21a-2020 - IEEE Standard for Control Switchboards--Amendment 1: Control and Secondary Circuits and Devices, and All Wiring

Published 2020

The Institute of Electrical and Electronics Engineers, Inc.

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9

1232.1-1997 - IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE): Data and Knowledge Specification

Published 1997

The Institute of Electrical and Electronics Engineers, Inc.

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10

1222-2011 - IEEE Standard for Testing and Performance for All-Dielectric Self-Supporting (ADSS) Fiber Optic Cable for Use on Electric Utility Power Lines

Published 2011

The Institute of Electrical and Electronics Engineers, Inc.

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11

C37.20.2a-2020 - IEEE Standard for Metal-Clad Switchgear—Amendment 1: Control and Secondary Circuits and Devices, and All Wiring

Published 2020

The Institute of Electrical and Electronics Engineers, Inc.

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12

1222-2019 - IEEE Standard for Testing and Performance for All-Dielectric Self-Supporting (ADSS) Fiber Optic Cable for Use on Electric Utility Power Lines

Published 2020

The Institute of Electrical and Electronics Engineers, Inc.

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13

299.1-2013 - IEEE Standard Method for Measuring the Shielding Effectiveness of Enclosures and Boxes Having all Dimensions between 0.1 m and 2 m

Published 2014

The Institute of Electrical and Electronics Engineers, Inc.

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14

62243-2012 - IEC 62243:2012(E) (IEEE Std 1232-2010): Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)

Published 2012

The Institute of Electrical and Electronics Engineers, Inc.

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15

1222-2011 - IEEE Standard for Testing and Performance for All-Dielectric Self-Supporting (ADSS...

Published 2011

The Institute of Electrical and Electronics Engineers, Inc.

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16

1222-2019 - IEEE Standard for Testing and Performance for All-Dielectric Self-Supporting (ADSS...

Published 2020

The Institute of Electrical and Electronics Engineers, Inc.

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17

62243-2012 - IEC 62243:2012(E) (IEEE Std 1232-2010): Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) - Redline

Published 2012

The Institute of Electrical and Electronics Engineers, Inc.

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18

62243-2002 - IEC 62243 Ed. 1 (IEEE Std 1232(TM)-2002): Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI- ESTATE)

Published 2002

The Institute of Electrical and Electronics Engineers, Inc.

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C37.20.1a-2020 - IEEE Standard for Metal-Enclosed Low-Voltage (1000 V ac and below, 3200 V dc and below) Power Circuit Breaker Switchgear - Amendment 1: Control and Secondary Circuits and Devices, and All Wiring

Published 2020

The Institute of Electrical and Electronics Engineers, Inc.