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dewey-ones:"620 - Engineering & allied operations"
product_txtF_mv:"Springer Book Archives -2004"
language:"English"
author_facet:"Cohen, Samuel H."
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Atomic Force Microscopy/Scanning Tunneling Microscopy 3
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620 - Engineering & allied operations
Language
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Springer Book Archives -2004
Author
Cohen, Samuel H.
Lightbody, Marcia L.
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Bray, M.T.
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