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author_facet:"Yuan, Kun"
dewey-ones:"371 - Schools & their activities; special education"
product_txtF_mv:"JSTOR Open Access Books"
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Measuring deeper learning through cognitively demanding test items : results from the analysis of six national and international exams
by
Yuan, Kun
,
Le, Vi-Nhuan
Published 2014
RAND Corporation
Subjects:
“
...Achievement tests /
United
States...
”
Call Number:
LB3060.3
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