1
by El-Kareh, Badih, Hutter, Lou N.
Published 2015
Springer New York
Table of Contents: ... -- Passive Components -- Process Integration -- Mismatch and Noise -- Chip Reliability...

2
by El-Kareh, Badih, Hutter, Lou N.
Published 2020
Springer International Publishing
Table of Contents: ... and Power Transistors -- Passive Components -- Process Integration -- Mismatch and Noise -- Chip Reliability...

3
by El-Kareh, Badih
Published 2009
Springer US
... interconnects - Analog devices and passive components - CMOS and BiCMOS process integration - DRAM, SRAM and NVM...