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00740nmm a2200181 u 4500 |
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EB002128699 |
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EBX01000000000000001266756 |
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00000000000000.0 |
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221110 ||| |
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|a 9781665434829
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020 |
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|a 9781665434812
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245 |
0 |
0 |
|a 2021 IEEE International Conference on Artificial Intelligence Testing (AITest)
|h Elektronische Ressource
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260 |
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|a New York
|b The Institute of Electrical and Electronics Engineers, Inc.
|c 2021
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653 |
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|a Computing and Processing; Engineering Profession; Robotics and Control Systems
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989 |
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|b IEEEPROC
|a IEEE Conference Proceedings
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856 |
4 |
0 |
|u https://ieeexplore.ieee.org/servlet/opac?punumber=9564290
|x Verlag
|3 Volltext
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082 |
0 |
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|a 600
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