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| 008 |
210123 ||| eng |
| 020 |
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|a 9781118498507
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| 020 |
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|a 9781118498484
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| 020 |
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|a 111849850X
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| 020 |
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|a 1118498518
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|a 9781118498514
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|a 1299188230
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|a 9781299188235
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| 050 |
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4 |
|a QH212.E4
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| 100 |
1 |
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|a Bell, D. C.
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| 245 |
0 |
0 |
|a Low voltage electron microscopy
|b principles and applications
|c edited by David C. Bell, Natasha Erdman
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| 260 |
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|a Chichester, West Sussex
|b John Wiley & Sons Inc. in association with the Royal Microscopical Society
|c 2013
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| 300 |
|
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|a xiii, 203 pages, 14 unnumbered pages of plates
|b illustrations (some color)
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| 505 |
0 |
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|a Includes bibliographical references and index
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| 505 |
0 |
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|a Introduction to the Theory and Advantages of Low Voltage Electron Microscopy / David C Bell, Natasha Erdman -- SEM Instrumentation Developments for Low kV Imaging and Microanalysis / Natasha Erdman, David C Bell -- Extreme High-Resolution (XHR) SEM Using a Beam Monochromator / Richard J Young, Gerard N A van Veen, Alexander Henstra, Lubomir Tuma -- The Application of Low-Voltage SEM : From Nanotechnology to Biological Research / Natasha Erdman, David C Bell -- Low Voltage High-Resolution Transmission Electron Microscopy / David C Bell -- Gentle STEM of Single Atoms: Low keV Imaging and Analysis at Ultimate Detection Limits / Ondrej L Krivanek, Wu Zhou, Matthew F Chisholm, Juan Carlos Idrobo, Tracy C Lovejoy, Quentin M Ramasse, Niklas Dellby -- Low Voltage Scanning Transmission Electron Microscopy of Oxide Interfaces / Robert Klie -- What's Next? The Future Directions in Low Voltage Electron Microscopy / David C Bell, Natasha Erdman
|
| 653 |
|
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|a Electron microscopy / Technique / http://id.loc.gov/authorities/subjects/sh85042222
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| 653 |
|
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|a Diagnostic Imaging / methods
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| 653 |
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|a SCIENCE / Electron Microscopes & Microscopy / bisacsh
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| 653 |
|
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|a Microscopy, Electron, Transmission
|
| 653 |
|
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|a Electron microscopy / Technique / fast
|
| 653 |
|
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|a SCIENCE / Microscopes & Microscopy / bisacsh
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| 653 |
|
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|a Microscopie électronique / Technique
|
| 700 |
1 |
|
|a Erdman, Natasha
|
| 041 |
0 |
7 |
|a eng
|2 ISO 639-2
|
| 989 |
|
|
|b OREILLY
|a O'Reilly
|
| 776 |
|
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|z 9781118498484
|
| 776 |
|
|
|z 9781119971115
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| 776 |
|
|
|z 111849850X
|
| 776 |
|
|
|z 111997111X
|
| 776 |
|
|
|z 9781118498507
|
| 776 |
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|z 9781118498514
|
| 776 |
|
|
|z 1118498518
|
| 856 |
4 |
0 |
|u https://learning.oreilly.com/library/view/~/9781118498484/?ar
|x Verlag
|3 Volltext
|
| 082 |
0 |
|
|a 500
|
| 082 |
0 |
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|a 502.8/25
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| 520 |
|
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|a "Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing. It serves as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology, and presents applications in nanotechnology and research of surface-related phenomena, allowing researches to observe materials as never before"--
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| 520 |
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|a "The book describes the recent advances in the area of low-voltage electron microscopy, covering topics in TEM, SEM, STEM"--
|