High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip

This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliabilit...

Full description

Bibliographic Details
Main Authors: Wang, Zheng, Chattopadhyay, Anupam (Author)
Format: eBook
Language:English
Published: Singapore Springer Nature Singapore 2018, 2018
Edition:1st ed. 2018
Series:Computer Architecture and Design Methodologies
Subjects:
Online Access:
Collection: Springer eBooks 2005- - Collection details see MPG.ReNa
Table of Contents:
  • Introduction
  • Background
  • Related Work
  • High-level Fault Injection and Simulation
  • Architectural Reliability Estimation
  • Architectural Reliability Exploration
  • System-level Reliability Exploration
  • Conclusion and Outlook