Metrology and Physical Mechanisms in New Generation Ionic Devices
The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author ach...
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| Format: | eBook |
| Language: | English |
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Cham
Springer International Publishing
2016, 2016
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| Edition: | 1st ed. 2016 |
| Series: | Springer Theses, Recognizing Outstanding Ph.D. Research
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| Collection: | Springer eBooks 2005- - Collection details see MPG.ReNa |
Table of Contents:
- Introduction
- Filamentary-Based Resistive Switching
- Nanoscaled Electrical Characterization
- Conductive Filaments: Formation, Observation and Manipulation
- Three-Dimensional Filament Observation
- Reliability Threats in CBRAM
- Conclusions and Outlook.