Testing for small-delay defects in nanoscale CMOS integrated circuits

Other Authors: Goel, Sandeep K. (Editor), Chakrabarty, Krishnendu (Editor)
Format: eBook
Language:English
Published: Boca Raton, FL CRC Press [2014]2014
Series:Devices, circuits, and systems
Subjects:
Online Access:
Collection: Safari Tech Books Online - Collection details see MPG.ReNa
Physical Description:1 online resource (xv, 222 pages) illustrations
ISBN:9781439829424
143982942X