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180413 ||| eng |
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|a 9780191707582
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|a 0191707589
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4 |
|a TA417.2
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1 |
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|a Banhart, John
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|a Advanced tomographic methods in materials research and engineering
|h Elektronische Ressource
|c edited by John Banhart
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| 260 |
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|a Oxford
|b Oxford University Press
|c 2008, 2008
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| 300 |
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|a xxv, 462 p., [4] p. of plates
|b ill
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| 505 |
0 |
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|a Includes bibliographical references and index
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| 653 |
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|a Materials / Research
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| 653 |
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|a Tomography / Industrial applications
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| 653 |
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|a Nondestructive testing
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| 041 |
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7 |
|a eng
|2 ISO 639-2
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| 989 |
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|b OUP
|a Oxford University Press
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| 490 |
0 |
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|a Monographs on the physics and chemistry of materials / Monographs on the physics and chemistry of materials
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| 028 |
5 |
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|a 10.1093/acprof:oso/9780199213245.001.0001
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| 856 |
4 |
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|u http://dx.doi.org/10.1093/acprof:oso/9780199213245.001.0001?nosfx=y
|x Verlag
|3 Volltext
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| 082 |
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|a 620.1'1272
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| 520 |
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|a Tomography provides 3D images of materials or engineering components and an unprecedented insight into their internal structure. This book discusses developments in the field, such as the extension of tomographic methods to materials research and engineering
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