High-Resolution Electron Microscopy for Materials Science
High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of...
| Main Authors: | , |
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| Format: | eBook |
| Language: | English |
| Published: |
Tokyo
Springer Japan
1998, 1998
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| Edition: | 1st ed. 1998 |
| Subjects: | |
| Online Access: | |
| Collection: | Springer Book Archives -2004 - Collection details see MPG.ReNa |
Table of Contents:
- 1. Basis of High-Resolution Electron Microscopy
- 1.1 Principles of Transmission Electron Microscopy
- 1.2 Electron Scattering and Fourier Transform
- 1.3 Formation of High-Resolution Images
- 1.4 Computer Simulation of High-Resolution Images
- References
- 2. Practice of High-Resolution Electron Microscopy
- 2.1 Classification of High-Resolution Images
- 2.2 Practice in Observing High-Resolution Images
- References
- 3. Application of High-Resolution Electron Microscopy
- 3.1 High-Resolution Images of Various Defects
- 3.2 High-Resolution Images of Various Materials
- References
- 4. Peripheral Instruments and Techniques for High-Resolution Electron Microscopy
- 4.1 Image Processing
- 4.2 Quantitative Analysis
- 4.3 Electron Diffraction
- 4.4 Weak-Beam Method
- 4.5 Evaluation of the Performance of Electron Microscopes
- 4.6 Specimen Preparation Techniques
- References
- Appendixes
- Appendix A. Physical Constants, Conversion Factors and Electron Wavelength
- Appendix B. Geometry of Crystal Lattice
- Appendix C. Typical Structures in Materials and Their Electron Diffraction Patterns
- Appendix D. Properties of Fourier Transform
- Appendix E. Sign Conventions