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140122 ||| eng |
| 020 |
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|a 9784431684220
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| 100 |
1 |
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|a Shindo, Daisuke
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| 245 |
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|a High-Resolution Electron Microscopy for Materials Science
|h Elektronische Ressource
|c by Daisuke Shindo, Hiraga Kenji
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| 250 |
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|a 1st ed. 1998
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| 260 |
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|a Tokyo
|b Springer Japan
|c 1998, 1998
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| 300 |
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|a IX, 190 p
|b online resource
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| 505 |
0 |
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|a 1. Basis of High-Resolution Electron Microscopy -- 1.1 Principles of Transmission Electron Microscopy -- 1.2 Electron Scattering and Fourier Transform -- 1.3 Formation of High-Resolution Images -- 1.4 Computer Simulation of High-Resolution Images -- References -- 2. Practice of High-Resolution Electron Microscopy -- 2.1 Classification of High-Resolution Images -- 2.2 Practice in Observing High-Resolution Images -- References -- 3. Application of High-Resolution Electron Microscopy -- 3.1 High-Resolution Images of Various Defects -- 3.2 High-Resolution Images of Various Materials -- References -- 4. Peripheral Instruments and Techniques for High-Resolution Electron Microscopy -- 4.1 Image Processing -- 4.2 Quantitative Analysis -- 4.3 Electron Diffraction -- 4.4 Weak-Beam Method -- 4.5 Evaluation of the Performance of Electron Microscopes -- 4.6 Specimen Preparation Techniques -- References -- Appendixes -- Appendix A. Physical Constants, Conversion Factors and Electron Wavelength -- Appendix B. Geometry of Crystal Lattice -- Appendix C. Typical Structures in Materials and Their Electron Diffraction Patterns -- Appendix D. Properties of Fourier Transform -- Appendix E. Sign Conventions
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| 653 |
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|a Physical measurements
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| 653 |
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|a Characterization and Evaluation of Materials
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| 653 |
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|a Materials science
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| 653 |
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|a Measurement Science and Instrumentation
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| 653 |
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|a Measurement
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| 700 |
1 |
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|a Kenji, Hiraga
|e [author]
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| 041 |
0 |
7 |
|a eng
|2 ISO 639-2
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| 989 |
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|b SBA
|a Springer Book Archives -2004
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| 856 |
4 |
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|u https://doi.org/10.1007/978-4-431-68422-0?nosfx=y
|x Verlag
|3 Volltext
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| 082 |
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|a 620.11
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| 520 |
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|a High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.
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