Electron Microbeam Analysis
This supplement of Mikrochimica Acta contains selected papers from the Second Workshop of the European Microbeam Analysis Society (EMAS) "Modern Developments and Applications in Microbeam Analysis", on which took place in May 1991 in Dubrovnik (Yugoslavia). EMAS was founded in 1987 by memb...
| Other Authors: | , |
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| Format: | eBook |
| Language: | English |
| Published: |
Vienna
Springer Vienna
1992, 1992
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| Edition: | 1st ed. 1992 |
| Series: | Mikrochimica Acta Supplementa
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| Subjects: | |
| Online Access: | |
| Collection: | Springer Book Archives -2004 - Collection details see MPG.ReNa |
Table of Contents:
- EPMA - A Versatile Technique for the Characterization of Thin Films and Layered Structures.
- Quantitative EPMA of the Ultra-Light Elements Boron Through Oxygen.
- Auger Microscopy and Electron Probe Microanalysis.
- Quantitative X-Ray Microanalysis of Ultra-Thin Resin-Embedded Biological Samples.
- Analytical and High-Resolution Electron Microscopy Studies at Metal/Ceramic Interfaces.
- Quantitative Electron Probe Microanalysis of Multi-layer Structures.
- Comparison of ? (?z) Curve Models in EPMA.
- Quantitative Electron Probe Microanalysis: New Accurate ? (?z) Description.
- A Modular Universal Correction Procedure for Quantitative EPMA.
- Monte Carlo Simulation of Backscattered and Secondary Electron Profiles.
- An Electron Scattering Model Applied to the Determination of Film Thicknesses Using Electron Probe Microanalysis.
- Calculation of Depth Distribution Functions for Characteristic and for Continuous Radiation.
- A Method for In-Situ Calibration of Semiconductor Detectors.
- Background Anomalies in Electron Probe Microanalysis Caused by Total Reflection.
- Automatic Analysis of Soft X-Ray Emission Spectra Obtained by EPMA.
- The Scanning Very-Low-Energy Electron Microscopy (SVLEEM).
- To the Backscattering Contrast in Scanning Auger Microscopy.
- Design Consideration Regarding the Use of an Accelerator on Mass Spectrometer in Ion Microanalysis.
- Accurate Estimation of Uncertainties in Quantitative Electron Energy- Loss Spectrometry.
- An EELS System for a TEM/STEM-Performance and Its Use in Materials Science.
- Quantitative X-Ray Microanalysis of Bio-Organic Bulk Specimens.
- Quantitative Analysis of (Y2O3)x (ZrO2)1-x Films on Silicon by EPMA.
- EPMA of Surface Oxide Films.
- Non-Destructive Determination of Ion-Implanted Impurity Distribution in Siliconby EPMA.
- An Electron Spectroscopy Study of a-SiNx Films.
- Electron Probe Microanalysis of Glass Fiber Optics.
- Quantitative Microanalysis of Low Concentrations of Carbon In Steels.
- Electron Configuration of the Valence-Conduction Band of the Mineral Wustite.
- Structural Analysis of Silver Halide Cubic Microcrystals with Epitaxial or Conversion Growths by STEM-EDX.
- Characterization of the Bony Matrix of the Otic Capsule in Human Fetuses by EPMA.
- Overview