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Secondary Ion Mass Spectrometry SIMS V Proceedings of the Fifth International Conference, Washington, DC, September 30 – October 4, 1985

Bibliographic Details
Other Authors: Benninghoven, Alfred (Editor), Colton, Richard J. (Editor), Simons, David S. (Editor), Werner, Helmut W. (Editor)
Format: eBook
Language:English
Published: Berlin, Heidelberg Springer Berlin Heidelberg 1986, 1986
Edition:1st ed. 1986
Series:Springer Series in Chemical Physics
Subjects:
Mass Spectroscopy
Physical Chemistry
Spectrum Analysis
Mass Spectrometry
Condensed Matter Physics
Spectroscopy
Condensed Matter
Online Access:
Collection: Springer Book Archives -2004 - Collection details see MPG.ReNa
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100 1 |a Benninghoven, Alfred  |e [editor] 
245 0 0 |a Secondary Ion Mass Spectrometry SIMS V  |h Elektronische Ressource  |b Proceedings of the Fifth International Conference, Washington, DC, September 30 – October 4, 1985  |c edited by Alfred Benninghoven, Richard J. Colton, David S. Simons, Helmut W. Werner 
250 |a 1st ed. 1986 
260 |a Berlin, Heidelberg  |b Springer Berlin Heidelberg  |c 1986, 1986 
300 |a XXII, 564 p  |b online resource 
505 0 |a I Retrospective -- II Fundamentals -- III Symposium: Detection of Sputtered Neutrals -- IV Detection Limits and Quantification -- V Instrumentation -- VI Techniques Closely Related to SIMS -- VII Combined Techniques and Surface Studies -- VIII Ion Microscopy and Image Analysis -- IX Depth Profiling and Semiconductor Applications -- X Metallurgical Applications -- XI Biological Applications -- XII Geological Applications -- XIII Symposium: Particle-Induced Emission from Organics -- XIV Organic Applications Including Fast Atom Bombardment Mass Spectrometry -- Index of Contributors 
653 |a Mass spectroscopy 
653 |a Physical chemistry 
653 |a Spectrum analysis 
653 |a Mass Spectrometry 
653 |a Condensed Matter Physics 
653 |a Spectroscopy 
653 |a Physical Chemistry 
653 |a Condensed matter 
700 1 |a Colton, Richard J.  |e [editor] 
700 1 |a Simons, David S.  |e [editor] 
700 1 |a Werner, Helmut W.  |e [editor] 
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490 0 |a Springer Series in Chemical Physics 
028 5 0 |a 10.1007/978-3-642-82724-2 
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