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|a 9783540408901
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|a Shvyd'ko, Yuri
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|a X-Ray Optics
|h Elektronische Ressource
|b High-Energy-Resolution Applications
|c by Yuri Shvyd'ko
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|a 1st ed. 2004
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|a Berlin, Heidelberg
|b Springer Berlin Heidelberg
|c 2004, 2004
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|a XIV, 406 p. 27 illus
|b online resource
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|a 1. Overview of the Field -- 2. Dynamical Theory of X-Ray Diffraction (Focus on Backscattering) -- 3. Principles of Multiple-Crystal X-Ray Diffraction -- 4. Theory of X-Ray Fabry-Pérot Resonators -- 5. High-Resolution X-Ray Monochromators -- 6. High-Resolution X-Ray Analyzers -- 7. Towards Realizing X-Ray Resonators -- A. Appendices -- A.1 Si Crystal Data -- A.3 Bragg Back-Reflections in Si -- A.5 Low-Lying Levels of Stable Isotopes -- A.8 Radiation Wavelength and Angle of Incidence for Exact Bragg Backscattering -- List of Symbols
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653 |
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|a Measurement
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653 |
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|a Laser
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|a Engineering
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653 |
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|a Lasers
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|a Measuring instruments
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|a Technology and Engineering
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|a Measurement Science and Instrumentation
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|a eng
|2 ISO 639-2
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|b SBA
|a Springer Book Archives -2004
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|a Springer Series in Optical Sciences
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|a 10.1007/978-3-540-40890-1
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|u https://doi.org/10.1007/978-3-540-40890-1?nosfx=y
|x Verlag
|3 Volltext
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|a 621.366
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|a The generation of radiation with well-defined frequency and wavelength, and the ability to precisely determine these quantities, are of fundamental importance in physics and other natural sciences. Monochromatic radiation enables both very accurate structure determinations and studies of the dynamics of living and non-living matter. It is crucial for the realization of standards of time and length, for the determination of fundamental constants, and for many other aspects of basic research. Bragg backscattering from perfect crystals is a tool for creating, manipulating, and analyzing x-rays with highest spectral purity. It has the unique feature of selecting x-rays with narrow spectral bandwidth. This book describes the theoretical foundations and principles of x-ray crystal optics with high spectral resolution. Various experimental studies and applications are presented and the author also addresses the development of instrumentation, such as high-resolution x-ray monochromators, analyzers, wavelength meters, resonators, and interferometers. The book will be a valuable source of information for all students and researchers working in the field of x-ray optics
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