Software Defect and Operational Profile Modeling

also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1

Bibliographic Details
Main Author: Kai-Yuan Cai
Format: eBook
Language:English
Published: New York, NY Springer US 1998, 1998
Edition:1st ed. 1998
Series:International Series in Software Engineering
Subjects:
Online Access:
Collection: Springer Book Archives -2004 - Collection details see MPG.ReNa
Description
Summary:also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1
Physical Description:XIX, 268 p online resource
ISBN:9781461555933