Rapid Reliability Assessment of VLSICs

The increasing application of integrated circuits in situations where high reliability is needed places a requirement on the manufacturer to use methods of testing to eliminate devices that may fail on service. One possible approach that is described in this book is to make precise electrical measur...

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Main Authors: Dorey, A.P., Jones, B.K. (Author), Richardson, A.M.D. (Author), Xu, Y.Z. (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: New York, NY Springer US 1990, 1990
Edition:1st ed. 1990
Subjects:
Online Access:
Collection: Springer Book Archives -2004 - Collection details see MPG.ReNa
Table of Contents:
  • 1 Introduction to VLSI Testing
  • 1.1 The Problem
  • 1.2 Reliability Testing
  • 1.3 The CMOS Process
  • 1.4 Failure Modes and Mechanisms in CMOS
  • 1.5 Outline of the Project
  • 1.6 Choice of Devices
  • 1.7 Outline of the Book
  • References
  • 2 The Devices Studied and Their Simulation
  • 2.1 Introduction
  • 2.2 Details of the Devices Studied
  • 2.3 SPICE Circuit Files and Device Parameters
  • 2.4 Simulation Procedures
  • 2.5 Results
  • 2.6 Conclusions
  • Reference
  • 3 The Tests and Stress Experiments
  • 3.1 Introduction to the Test Procedures
  • 3.2 Accelerated Stress Methods
  • 3.3 Details of the Tests Used
  • 3.4 Organization of the Experiment
  • References
  • 4 Assessment of the Tests as Predictors of Failure
  • 4.1 Behavior of the Devices Subject to Thermal and Electrical Stress
  • 4.2 Behavior of Devices Subject to Ionizing Irradiation Stress
  • 4.3 Assessment of the Tests
  • References
  • 5 Implementation of the Tests for Industrial Use
  • 5.1 Introduction
  • 5.2 Test Strate