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140122 ||| eng |
| 020 |
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|a 9780306470776
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| 100 |
1 |
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|a Billinge, S.J.L.
|e [editor]
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| 245 |
0 |
0 |
|a Local Structure from Diffraction
|h Elektronische Ressource
|c edited by S.J.L. Billinge, M.F. Thorpe
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| 250 |
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|a 1st ed. 2002
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| 260 |
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|a New York, NY
|b Springer US
|c 2002, 2002
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| 300 |
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|a XI, 399 p
|b online resource
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| 505 |
0 |
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|a PDF Analysis Applied to Crystalline Materials -- Anomalous X-Ray Scattering from Disordered Materials -- The Recording and Interpretation of Diffuse X-Ray Scattering -- Recent Advances in Structure Refinement for Liquids and Disordered Materials -- Neutron Scattering and Monte Carlo Studies of Disorder in Oxides and Hydrides -- Reverse Monte Carlo Refinement of Disordered Silica Phases -- Modelling Single Crystal Diffuse Neutron Scattering Using Reverse Monte Carlo -- Real-Space Rietveld: Full Profile Structural Refinement of the Atomic Pair Distribution Function -- Advances in Pair Distribution Profile Fitting in Alloys -- Local Atomic Arrangements in Binary Solid Solutions Studied by X-Ray and Neutron Diffuse Scattering from Single Crystals -- Fermi Surface Effects in the Diffuse Scattering from Alloys -- Non-Mean-Field Theories of Short Range Order and Diffuse Scattering Anomalies in Disordered Alloys -- Diffuse Scattering by Crystals with Defects of Coulomb Displacement Field -- Short-Range Disorder and Long-Range Order: Implications of the “Rigid Unit Mode” Picture -- Vibrational Entropy and Local Structures of Solids -- Diffuse Scattering by Domain Structures -- Recent “Local” Structural Studies: Metallic Alloys, Superconductors and Proteins -- Studies of Local Structure in Polymers Using X-Ray Scattering -- Diffuse X-Ray and Neutron Reflection from Surfaces and Interfaces -- Studying Growth Kinetics of Metallic Multilayers Using Elastic X-Ray Diffuse Scattering
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| 653 |
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|a Mechanics, Applied
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| 653 |
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|a Physical chemistry
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| 653 |
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|a Condensed Matter Physics
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| 653 |
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|a Analytical chemistry
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| 653 |
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|a Physical Chemistry
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| 653 |
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|a Analytical Chemistry
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| 653 |
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|a Engineering Mechanics
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| 653 |
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|a Materials / Analysis
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| 653 |
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|a Characterization and Analytical Technique
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| 653 |
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|a Condensed matter
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| 700 |
1 |
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|a Thorpe, M.F.
|e [editor]
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| 041 |
0 |
7 |
|a eng
|2 ISO 639-2
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| 989 |
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|b SBA
|a Springer Book Archives -2004
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| 490 |
0 |
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|a Fundamental Materials Research
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| 028 |
5 |
0 |
|a 10.1007/b119172
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| 856 |
4 |
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|u https://doi.org/10.1007/b119172?nosfx=y
|x Verlag
|3 Volltext
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| 082 |
0 |
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|a 620.1
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| 520 |
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|a This series of books, which is published at the rate of about one per year, addresses fundamental problems in materials science. The contents cover a broad range of topics from small clusters of atoms to engineering materials and involve chemistry, physics, materials science and engineering, with length scales ranging from Ångstroms up to millimeters. The emphasis is on basic science rather than on applications. Each book focuses on a single area of current interest and brings together leading experts to give an up-to-date discussion of their work and the work of others. Each article contains enough references that the interested reader can access the relevant literature. Thanks are given to the Center for Fundamental Materials Research at Michigan State University for supporting this series. M.F. Thorpe, Series Editor E-mail: thorpe @ pa.msu.edu East Lansing, Michigan PREFACE One of the most challenging problems in the study of structure is to characterize the atomic short-range order in materials. Long-range order can be determined with a high degree of accuracy by analyzing Bragg peak positions and intensities in data from single crystals or powders. However, information about short-range order is contained in the diffuse scattering intensity. This is difficult to analyze because it is low in absolute intensity (though the integrated intensity may be significant) and widely spread in reciprocal space
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