APA Citation

Noia, B. (2014). Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs. Cham: Springer International Publishing.

Chicago Style Citation

Noia, Brandon. Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs. Cham: Springer International Publishing, 2014.

MLA Citation

Noia, Brandon. Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs. Cham: Springer International Publishing, 2014.

Warning: These citations may not always be 100% accurate.